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CSI Semi: Used and Refurbished Semiconductor Equipment. Surplus Semiconductor Equipment Service Provider.
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Metrology

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  • Olympus MX40 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • SEM – Critical Dimension (CD) Measurement

    $0.00
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  • Video Measuring System

    $0.00
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  • KLA-TENCOR AlphaStep 300 Profilometer

    $0.00
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  • Hitachi (semiconductor) S 9380 II

    $0.00
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  • AMAT SEMVision G3

    $0.00
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  • Met One – Model 214-220-1

    $0.00
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  • Darkfield Inspection

    $0.00
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  • Leica MIS200 Ergoplan Inspection Station

    $0.00
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  • PLASMOS SD2003 Automatic Ellipsometer

    $0.00
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  • KLA Surfscan SP1 DLS Particle Measurement – used semiconductor equipment

    $0.00
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  • SEM – Critical Dimension (CD) Measurement

    $0.00
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  • Darkfield Inspection

    $0.00
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  • BIORAD QS-300 FT-IR Spectrometer 200mm

    $0.00
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  • TENCOR M-Gage 300 Non Contact Resistance with DDC

    $0.00
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  • Rudolph NSX 90

    $0.00
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  • SEM – Critical Dimension (CD) Measurement

    $0.00
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  • Image Sensor Tester

    $0.00
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  • KLA-TENCOR FT-750 Film Thickness Inspection

    $0.00
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  • KLA TENCOR 2800

    $0.00
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  • AMAT SEMVision G3 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • SONOSCAN C-SAM 3100 (Acoustical Microscope)

    $0.00
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  • Darkfield Inspection

    $0.00
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  • Leica MIS201 Ergoplan Inspection Station

    $0.00
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  • PROMETRIX FT-750 Film Thickness Measuring

    $0.00
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  • used semiconductor equipment

    HITACHI FB2000 + FB2100 FIB SYSTEMS

    $0.00
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  • NIKON NEXIV-VMR-3020 Video Measuring System Vintage 2015

    Nikon NEXIV VMZ-R3020 Multisensor 3D Video Meaurement CMM Vintage 2015 Type 2

    $0.00
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  • SEM – Defect Review (DR)

    $0.00
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  • Macro-Defect

    $0.00
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  • BIORAD QS-408M Manual FT-IR Spectrometer for Epi, SiN, BPSG

    $0.00
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  • TENCOR P20h Long Scan Profiler

    $0.00
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  • Rudolph NSX 90 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • SEM – Critical Dimension (CD) Measurement

    $0.00
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  • Edge Defect

    $0.00
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  • KLA-TENCOR UV 1080 UV Film Thickness Tool

    $0.00
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  • KLA TENCOR AIT II

    $0.00
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  • AMAT Uvision 200

    $0.00
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  • Leica INM100 Wafer Inspection Microscope, Brightfield and Darkfield

    $25,000.00
    Add to cart Show Details
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