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Metrology
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“SONOSCAN C-SAM 3100 (Acoustical Microscope)” has been added to your cart.
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RIGAKU 3640 Xray Fluorescence Wafer/Disk Analyzer
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RIGAKU 3700H Xray Fluorescence Wafer/Disk Analyzer
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Rudolph FE IV Ellipsometer
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Rudolph FE IV Ellipsometer 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Rudolph FE-IV Ellipsometer
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Rudolph FE-VII Ellipsometer
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Rudolph NSX 90
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Rudolph NSX 90 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Rudolph NSX 95
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Rudolph NSX 95 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Rudolph Technologies AXI 935D Macro Inspection System
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SAGAX Isoscope 125 Film Thickness Monitor
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SDI FAaST-330 Dielectric Characterization Tool
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SEM – Critical Dimension (CD) Measurement
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SEM – Critical Dimension (CD) Measurement
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SEM – Critical Dimension (CD) Measurement
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SEM – Critical Dimension (CD) Measurement
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SEM – Critical Dimension (CD) Measurement
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SEM – Critical Dimension (CD) Measurement
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SEM – Critical Dimension (CD) Measurement
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SEM – Defect Review (DR)
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Semicon China Equipment For Sale
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Shimadzu DUH 202 Ultra Micro Hardness Tester
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SONIX Autowafer Scanning Acoustic Microscope
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SONIX Autowafer Scanning Acoustic Microscope 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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SONOSCAN C-SAM 3100 (Acoustical Microscope)
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TEMESCAL 0040-1054-2 XY Sweep Controller
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TENCOR Alphastep 300 Profilometer
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TENCOR M-Gage 300 Non Contact Resistance with DDC
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TENCOR M-Gage 300 Non Contact Resistance monitor
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TENCOR P20h Long Scan Profiler
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TENCOR Surfscan 4500 Wafer surface inspection
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Thermawave 2600(8inch) for sale
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VEECO Controller only
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Video Measuring System
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Vision System
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X-ray Fluorescence Spectrometer
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二手半导体设备、库存半导体设备、翻新半导体设备、二手测试设备、翻新测试设备、库存测试设备、二手自动测试设备、二手印制电路板（pcb）组装设备、组装设备、二手电子组装设备、二手电子测试设备、半导体固定设备
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