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Metrology

View cart “Olympus MX40 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung” has been added to your cart.
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  • BROOKFIELD RVT Viscometer

    $0.00
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  • BROOKFIELD DV-11+ Viscometer

    $0.00
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  • BIORAD QS-500 FT-IR Spectrometer

    $0.00
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  • BIORAD QS-408M Manual FT-IR Spectrometer for Epi, SiN, BPSG

    $0.00
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  • BIORAD QS-300 FT-IR Spectrometer 200mm

    $0.00
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  • BIORAD QS-1200 FT-IR Spectrometer 300mm

    $0.00
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  • BIORAD Q8 Overlay Metrology Tool

    $0.00
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  • BIORAD Q7/Q8 Overlay Metrology Tool

    $0.00
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  • BIORAD Q7 Overlay Metrology Tool

    $0.00
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  • BIORAD Q6 Overlay Metrology Tool

    $0.00
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  • BIORAD Q5 Overlay Metrology Tool

    $0.00
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  • ADE Episcan 1000 FT-IR

    $0.00
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  • KLA Tencor 7600 Surfscan

    $0.00
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  • KLA 2608 Wafer Review Station

    $0.00
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  • Leica MIS201 Ergoplan Inspection Station

    $0.00
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  • Leica MIS200 Ergoplan Inspection Station

    $0.00
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  • KLA 2608 Wafer Review Station

    $0.00
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  • KLA 2131 Defect Inspection

    $0.00
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  • Optical Review System

    $0.00
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  • Optical Review System

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  • Atomic Force Microscope (AFM)

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  • Acoustic Micro Imaging

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  • Automated Thickness Measurement System

    $0.00
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  • X-ray Fluorescence Spectrometer

    $0.00
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  • Edge Defect

    $0.00
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  • Image Sensor Tester

    $0.00
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  • Video Measuring System

    $0.00
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  • Critical Dimension (CD) Measurement (non SEM)

    $0.00
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  • Optical Review System

    $0.00
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  • FT-IR

    $0.00
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Page 4 of 6«‹23456›»

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