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    • × used semiconductor equipmentApplied Materials Centura 4.0 DPN Gate Stack 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung 1 × $0.00

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  • KLA-TENCOR Archer AIM+ Inspection OVERLAY

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    KLA SP1 DLS Tencor

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    TEL P12XL with VIP3 wafer prober hindge

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  • KLA-Tencor Spectra FX 100 300 mm

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  • NuFlareTechnology HT2000B 150 mm

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  • Olympus Model AL3310F Microscope

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  • APPLIED MATERIALS 0021-20381

    $175.00
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  • Datacon 2200 APM+

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  • Leica Charge-Coupled Device (CCD) for Polyvar Transmission Electron Microscopy (TEM)

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  • APPLIED MATERIALS 0100-35218

    $417.00
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  • Dage 2400A Wire Pull, Die Shear, Ball Shear Tester

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  • Olympus Olympus AL3120F 12″

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  • MKS  627A11TBC 

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    Canon BESTEM D02 Bonder

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  • TEL CS1B05-100530-12

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    DISCO Laser Scriber DFL7160

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  • Kokusai DJ-853V Diffusion Furnace

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  • KLA-Tencor RS100 300 mm

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  • MATTSON SUPREMA

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    Hitachi S3400n /w EDS and coater S3400n

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    Varian Semiconductor Equipment Associates VIISta 810XP

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    BioRad Overlay Metrology System Quaestor Q7

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  • HAMAMATSU PHEMOS2000 * 300mm

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  • USHIO  UIT-201 

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  • Applied Materials Centura DPN 300 mm

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    LAM Research 2300 Exelan Flex 45

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  • MYKROLIS CWUZ8S0P1

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    Teradyne Catalyst Tester

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  • NICOLET ECO1000

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  • SMS RBT1A0016

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