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Macro-Defect
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BROOKFIELD DV-11+ Viscometer
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VEECO Controller only
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Rudolph NSX 95 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Brightfield Inspection
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Automated Thickness Measurement System
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NANOMETRICS Nanoline CD-50 Measurement Tool
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KLA AIT XUV
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Hitachi CG4000
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FT-IR
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Darkfield Inspection
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ADE Episcan 1000 FT-IR
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RIGAKU 3640 Xray Fluorescence Wafer/Disk Analyzer
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二手半导体设备、库存半导体设备、翻新半导体设备、二手测试设备、翻新测试设备、库存测试设备、二手自动测试设备、二手印制电路板（pcb）组装设备、组装设备、二手电子组装设备、二手电子测试设备、半导体固定设备
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KLA SP1 CLASSIC Wafer Surface Analysis WAFER INSPECTION
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