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    • × PlaceholderAxcelis(Eaton/Fusion) 200PCU 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung 1 × $0.00
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CSI Semi: Used and Refurbished Semiconductor Equipment. Surplus Semiconductor Equipment Service Provider.
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Metrology

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  • SONIX Autowafer Scanning Acoustic Microscope 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • Film Thickness measurment

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  • Darkfield Inspection

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  • Optical Review System

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  • PARTICLE MEASUREMENT SYSTEMS PDS-PB

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  • KLA UV1080 OPEN CASSETTE 二手半导体设备销售, 중고 반도체 장비 판매,

    $0.00
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  • Rudolph FE-IV Ellipsometer

    $0.00
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  • Darkfield Inspection

    $0.00
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  • Overlay Measurement System

    $0.00
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  • BIORAD Q7/Q8 Overlay Metrology Tool

    $0.00
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  • TEMESCAL 0040-1054-2 XY Sweep Controller

    $0.00
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  • Nikon MM 60 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • Rudolph Technologies AXI 935D Macro Inspection System

    $0.00
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  • FE SEM

    $0.00
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  • Optical Review System

    $0.00
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  • HITACHI S-7000 CD SEM

    $0.00
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  • Hitachi (Semiconductor) RS 5000

    $0.00
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  • Axiospect 300 Optical

    $0.00
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  • Film Thickness measurment

    $0.00
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  • Darkfield Inspection

    $0.00
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  • KLA 2131 Defect Inspection

    $0.00
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  • PHILIPS SPW-2800 Xray Fluorescence Metrology

    $0.00
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  • KLA ASET F5 Thin Film Measurement, 测量薄膜, 박막 측정,

    $0.00
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  • KLA 6220

    KLA-TENCOR SURFSCAN 6220 DEFECT INSPECTION SYSTEM

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  • Darkfield Inspection

    $0.00
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  • Overlay Measurement System

    $0.00
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  • BIORAD Q8 Overlay Metrology Tool

    $0.00
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  • TENCOR Alphastep 300 Profilometer

    $0.00
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  • Olympus MX40

    $0.00
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  • Thermawave optiprobe 2600

    Thermawave 2600(8inch) for sale

    $0.00
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  • SEM – Critical Dimension (CD) Measurement

    $0.00
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  • Critical Dimension (CD) Measurement (non SEM)

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  • IONIC SYSTEMS Stressgauge II Wafer Stress Measurement

    $0.00
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  • Hitachi (Semiconductor) RS 5500

    $0.00
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  • Axiospect 300 Optical 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • HIAC Model 5120 Particle Counter

    $0.00
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  • Darkfield Inspection

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  • KLA 2608 Wafer Review Station

    $0.00
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  • PLASMOS SD2000 Automatic Ellipsometer

    $0.00
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  • KLA SEM eCD-2 inspection measurement analysis – used metrology equipment

    $0.00
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  • Olympus MX51

    Olympus MX51 Inspection Microscope

    $0.00
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  • SEM – Critical Dimension (CD) Measurement

    $0.00
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  • Overlay Measurement System

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  • BIORAD QS-1200 FT-IR Spectrometer 300mm

    $0.00
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  • TENCOR M-Gage 300 Non Contact Resistance monitor

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