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Metrology

View cart “SEM – Critical Dimension (CD) Measurement” has been added to your cart.
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  • TENCOR Surfscan 4500 Wafer surface inspection

    $0.00
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  • TENCOR P20h Long Scan Profiler

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  • TENCOR M-Gage 300 Non Contact Resistance with DDC

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  • TENCOR M-Gage 300 Non Contact Resistance monitor

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  • TENCOR Alphastep 300 Profilometer

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  • TEMESCAL 0040-1054-2 XY Sweep Controller

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  • SDI FAaST-330 Dielectric Characterization Tool

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  • SAGAX Isoscope 125 Film Thickness Monitor

    $0.00
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  • RIGAKU 3700H Xray Fluorescence Wafer/Disk Analyzer

    $0.00
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  • RIGAKU 3640 Xray Fluorescence Wafer/Disk Analyzer

    $0.00
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  • RIGAKU 3640 Xray Fluorescence Wafer/Disk Analyzer

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  • RIGAKU 3630 Xray Fluorescence Wafer/Disk Analyzer

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  • PROMETRIX FT-750 Film Thickness Measuring

    $0.00
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  • PLASMOS SD2003 Automatic Ellipsometer

    $0.00
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  • PLASMOS SD2000 Automatic Ellipsometer

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  • PHILIPS SPW-2800 Xray Fluorescence Metrology

    $0.00
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  • PARTICLE MEASUREMENT SYSTEMS PDS-PB

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  • NICOLET Magna 550

    $0.00
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  • NANOMETRICS Nanospec 2100 Film Thickness Measurement

    $0.00
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  • NANOMETRICS Nanospec 181 Film Thickness Measurement

    $0.00
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  • NANOMETRICS Nanoline CD-50 Measurement Tool

    $0.00
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  • MKS PAS Residual Gas Analyzer

    $0.00
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  • KLA-TENCOR UV 1080 UV Film Thickness Tool

    $0.00
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  • KLA-TENCOR FT-750 Film Thickness Inspection

    $0.00
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  • KLA-TENCOR AlphaStep 300 Profilometer

    $0.00
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  • IONIC SYSTEMS Stressgauge II Wafer Stress Measurement

    $0.00
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  • HITACHI S-7000 CD SEM

    $0.00
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  • GCA/TROPEL 9000 Surface Flatness Analyzer

    $0.00
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  • CR TECHNOLOGY UF160-0 Xray System

    $0.00
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  • CLIMET Ultimate 100 Aerosol Particle Counter

    $0.00
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Page 3 of 6‹12345›»

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