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CSI Semi: Used and Refurbished Semiconductor Equipment. Surplus Semiconductor Equipment Service Provider.
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Metrology

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  • TENCOR Surfscan 4500 Wafer surface inspection

    $0.00
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  • Rudolph NSX 95

    $0.00
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  • Brightfield Inspection

    $0.00
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  • X-ray Fluorescence Spectrometer

    $0.00
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  • MKS PAS Residual Gas Analyzer

    $0.00
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  • KLA AIT XP+

    $0.00
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  • AMAT Uvision 200 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • Shimadzu DUH 202 Ultra Micro Hardness Tester

    $0.00
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  • Darkfield Inspection

    $0.00
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  • KLA Tencor 7600 Surfscan

    $0.00
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  • RIGAKU 3640 Xray Fluorescence Wafer/Disk Analyzer

    $0.00
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  • used semiconductor equipment

    quipement semi-conducteur, l’achat et la vente d’quipement de test et de fabrication de semi-conducteurs d

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  • Brightfield Inspection

    $0.00
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  • BROOKFIELD DV-11+ Viscometer

    $0.00
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  • VEECO Controller only

    $0.00
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  • Rudolph NSX 95 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • Brightfield Inspection

    $0.00
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  • Automated Thickness Measurement System

    $0.00
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  • NANOMETRICS Nanoline CD-50 Measurement Tool

    $0.00
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  • KLA AIT XUV

    $0.00
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  • FT-IR

    $0.00
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  • Darkfield Inspection

    $0.00
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  • ADE Episcan 1000 FT-IR

    $0.00
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  • RIGAKU 3640 Xray Fluorescence Wafer/Disk Analyzer

    $0.00
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  • used semiconductor equipment

    二手半导体设备、库存半导体设备、翻新半导体设备、二手测试设备、翻新测试设备、库存测试设备、二手自动测试设备、二手印制电路板（pcb）组装设备、组装设备、二手电子组装设备、二手电子测试设备、半导体固定设备

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  • KLA SP1 Classic FOR SALE

    KLA SP1 CLASSIC Wafer Surface Analysis WAFER INSPECTION

    $0.00
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  • SEM – Critical Dimension (CD) Measurement

    $0.00
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  • Macro-Defect

    $0.00
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  • BROOKFIELD RVT Viscometer

    $0.00
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  • ADE 9500 Ultrascan Wafer Inspection System

    $0.00
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  • KLA KLA5200

    $0.00
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  • Parts/Options

    $0.00
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  • Acoustic Micro Imaging

    $0.00
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  • NANOMETRICS Nanospec 181 Film Thickness Measurement

    $0.00
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  • FT-IR

    $0.00
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  • Darkfield Inspection

    $0.00
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  • BIORAD Q5 Overlay Metrology Tool

    $0.00
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  • RIGAKU 3700H Xray Fluorescence Wafer/Disk Analyzer

    $0.00
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  • used semiconductor equipment

    Rudolph FE IV Ellipsometer

    $0.00
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  • Brightfield Inspection

    $0.00
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  • Luminescence Measurement

    $0.00
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  • CLIMET Ultimate 100 Aerosol Particle Counter

    $0.00
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  • Leica Polylite 88 – Reichert Incident Light Microscope – Wafer Inspection

    $0.00
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  • KLA KLA5200 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • Darkfield Inspection

    $0.00
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