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Metrology

View cart “Nikon S204B 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung” has been added to your cart.
View cart “Automated Thickness Measurement System” has been added to your cart.
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  • Darkfield Inspection

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  • Darkfield Inspection

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  • Darkfield Inspection

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  • Dektak 3030

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  • Edge Defect

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  • FE SEM

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  • FE SEM

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  • Film Thickness measurment

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  • Film Thickness measurment

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  • Film Thickness Measurement System

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  • FT-IR

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  • FT-IR

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  • FT-IR

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  • GCA/TROPEL 9000 Surface Flatness Analyzer

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  • HIAC Model 5120 Particle Counter

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  • Hitachi (Semiconductor) IS 3000

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  • Hitachi (Semiconductor) RS 5000

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  • Hitachi (Semiconductor) RS 5500

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  • Hitachi (semiconductor) S 9380 II

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  • Hitachi CG4000

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  • used semiconductor equipment

    HITACHI FB2000 + FB2100 FIB SYSTEMS

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  • Hitachi S-3400N

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  • HITACHI S-7000 CD SEM

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  • used semiconductor equipment

    HITACHI S5000 SEM

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  • Image Sensor Tester

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  • IONIC SYSTEMS Stressgauge II Wafer Stress Measurement

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  • KLA ASET F5 Thin Film Measurement, 测量薄膜, 박막 측정,

    $0.00
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  • KLA UV1080 OPEN CASSETTE 二手半导体设备销售, 중고 반도체 장비 판매,

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  • KLA UV1280SE 二手半导体设备销售, 중고 반도체 장비 판매

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  • KLA 2131 Defect Inspection

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  • KLA 2608 Wafer Review Station

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  • KLA 2608 Wafer Review Station

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  • KLA AIT XP+

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  • KLA AIT XUV

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  • KLA KLA5200

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  • KLA KLA5200 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • KLA SEM eCD-2 inspection measurement analysis – used metrology equipment

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  • KLA SP1 Classic FOR SALE

    KLA SP1 CLASSIC Wafer Surface Analysis WAFER INSPECTION

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  • KLA SP1 DLS 1 Surfscan

    KLA SP1 DLS for sale

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  • KLA Surfscan SP1 DLS Particle Measurement – used semiconductor equipment

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  • KLA TENCOR 2800

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