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PLASMOS SD2003 Automatic Ellipsometer
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KLA Surfscan SP1 DLS Particle Measurement – used semiconductor equipment
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0.00
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SEM – Critical Dimension (CD) Measurement
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0.00
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Darkfield Inspection
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0.00
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BIORAD QS-300 FT-IR Spectrometer 200mm
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0.00
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TENCOR M-Gage 300 Non Contact Resistance with DDC
$
0.00
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Rudolph NSX 90
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0.00
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Leica INM100 Wafer Inspection Microscope, Brightfield and Darkfield
$
25,000.00
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