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KLA ASET F5 Thin Film Measurement, 测量薄膜, 박막 측정,
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Applied Materials Uvision 3
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KLA Aset F5X
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Advanced Metrology Systems LLC (AMS) IR3000
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Nikon MM 60
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APPLIED MATERIALS SEMVISION G2
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Hitachi (Semiconductor) RS 5500
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Axiospect 300 Optical 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Zeiss Axiotron II Microscopes (8 units available)
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KLA 2132 wafer defect inspection
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KLA 6420 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Hitachi CG4000
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Applied Materials Complus 4T
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Nikon MM 60 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Hitachi S-9200
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