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CSI Semi: Used and Refurbished Semiconductor Equipment. Surplus Semiconductor Equipment Service Provider.
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Metrology

View cart “Applied Materials Veritystem 2” has been added to your cart.
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  • KLA 6420 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Hitachi S-3400N

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  • KLA Surfscan SP1 DLS Particle Measurement – used semiconductor equipment

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  • KLA TENCOR PROMETRIX UV1280SE

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  • KLA-Tencor Surfscan SP1 DLS

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  • KLA ASET F5X Thin Film Metrology 중고 반도체 장비 박막 계측, 二手半导体设备测量薄膜,

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  • APPLIED MATERIALS SEMVISION G4

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  • KLA ASET F5 Thin Film Measurement, 测量薄膜, 박막 측정,

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  • Hitachi CG4000

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  • Dektak 150 Surface Profiler

    Dektak 150 Surface Profiler + Warranty + Delivery to USA

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  • Hitachi S4800 with EDS 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Hitachi S8840 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • KLA UV1280SE 二手半导体设备销售, 중고 반도체 장비 판매

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  • Hitachi S8820 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • KLA P16+ Surface profiler

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  • Hitachi (Semiconductor) RS 5500

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  • Hitachi S8820HSA

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  • KLA 5400 Film Stress Measurement

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  • KLA TENCOR RS 75A OMNIMAP

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  • KLA Surfscan 7600 Patterned Wafer Inspection 8 Inch

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  • KLA SP1 DLS 1 Surfscan

    KLA SP1 DLS for sale

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  • Semicon China Equipment For Sale

    Semicon China Equipment For Sale

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  • Rudolph Metapulse 300 Film Thickness Measurment System

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  • used semiconductor equipment

    Rudolph FE IV Ellipsometer

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  • Applied Materials Veritysem

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  • KLA KLA5200 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • KLA-Tencor Surfscan 6220 Defect Inspection System

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    Nikon VMR 3020 NEXIV

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  • ADE 9300 Ultrascan

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  • used semiconductor equipment

    Rudolph FE IV Ellipsometer 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Nikon AMI-3500

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  • Applied Materials Veritystem 2

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  • SONIX Autowafer Scanning Acoustic Microscope

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  • Rudolph FE-VII Ellipsometer

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  • KLA UV1080 OPEN CASSETTE 二手半导体设备销售, 중고 반도체 장비 판매,

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  • Rudolph NSX 95 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Hitachi RS4000 CD-SEM

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  • used semiconductor equipment

    Accent Optical Biorad QS 500

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  • OLYMPUS MM6C-CS50-2 (2D Scope)

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  • Applied System Veritystem 3

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  • SONIX Autowafer Scanning Acoustic Microscope 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • Rudolph FE-IV Ellipsometer

    $0.00
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  • Airco / Temescal BJD 1800 E-Beam System

    $0.00
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  • DAGE XD7600 NT X-RAY

    $0.00
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  • Leica Polylite 88 – Reichert Incident Light Microscope – Wafer Inspection

    $0.00
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Page 1 of 3123

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