Facilities Equipment

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Accretech Win Win 50 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Accretech Win Win 50
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Olympus AL3110F Microscope 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Olympus AL3110F Microscope
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DNS SKW-80A-BV 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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DNS SKW-80A-BV
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二手半导体设备、库存半导体设备、翻新半导体设备、二手测试设备、翻新测试设备、库存测试设备、二手自动测试设备、二手印制电路板（pcb）组装设备、组装设备、二手电子组装设备、二手电子测试设备、半导体固定设备

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quipement semi-conducteur, l’achat et la vente d’quipement de test et de fabrication de semi-conducteurs d

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KLA SEM eCD-2 inspection measurement analysis – used metrology equipment
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30 Day Warranty Parts, AMAT, LAM, Novellus, Nikon,Varian, KLA, TEL, SVG, Cryogenics, Gasonics, Hitachi, Keithley, HP, MFC,
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Advanced Thermal Sciences (ATS) NX-20A-GL
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Leica Polylite 88 – Reichert Incident Light Microscope – Wafer Inspection
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Edwards IF30K Vacuum pump and blower
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Neslab CFT-150 Programmable Chiller, PD2 PUMP, 208-230VAC 1/3 HP R-22
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Ebara A70W
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