Key Item Details

Condition:

Good

Operational Service:

Missing HDD

Product ID:

CSISEM061120261553

Wafer Sizes:

300mm

Vintage:

2006

Description

AMAT SEMVision GX Defect Review SEM

Wafer Size: 300mm

Vintage: 2006

HDD Not Included

SECS/GEM capable. Factory interface uses OHT WIP delivery with two 25-wafer front opening unified pod (FOUP) carriers. Includes a SEM review station with 2 nm physical resolution, complete 3D data for superior defect visualization and classification, and analysis of defects as small as 30 nm. Facility requirements: OFA, process vacuum, gases, process cooling water, and ultra pure water

Available November 2026