CSI Semi: Used and Refurbished Semiconductor Equipment. Surplus Semiconductor Equipment Service Provider.

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300mm Clean Oven – Espec ‘PVHC-431MS ‘
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300mm Contact Angle Measurment Tester – Kyowa Interface Science ‘Drop Master 700D ‘
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300mm Crystal Edge – ACCRETECH ‘Crystal Edge 2.0 ‘
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300mm Furnace Group Controller – TEL ‘300 ‘
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300mm Metal CVD – TEL ‘TRIAS ‘
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300mm Metal Thickness Measurment Tester – Jordan Valley ‘JVX 6200 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3300 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3300 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3301 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3302 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3303 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3304 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3305 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3306 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3307 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3308 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3309 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3310 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3311 ‘
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300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3312 ‘
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300mm Mixed Memory/Loic IC Test System – HP ‘V3300 ‘
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300mm Mixed Memory/Loic IC Test System – HP ‘V3300 ‘
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300mm Mixed Memory/Loic IC Test System – HP ‘V3300 ‘
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300mm Poly – Kokusai ‘Quixace Poly ‘
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300mm Resistivity Test System – Kokusai ‘VR-120/08SD ‘
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300mm Resistivity Test System – Kokusai ‘VR-120/08SD ‘
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300mm Slurry &amp Cleaning Chemical Distribution System – Celerity ‘MegaFlow-VII ‘ (2007).
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300mm Tester – RIGAKU ‘MFM65 ‘
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300mm Wafer Inspection System – JEOL ‘JWS-3000 ‘
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300mm Wafer Inspection System – JEOL ‘JWS-3000 ‘
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300mm Wide Area AFM – Hitachi ‘WA1350 ‘
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3ea Rohde & Schwarz URV5 Millivoltmeter, p/n 394.8010.02.
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4-inch HFCVD System for CVD Diamond and Related Materials 4-inch HFCVD System for CVD Diamond and Related Materials
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5 Station mesh stamper/placer
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5 UP H73.5UP-002
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5″ Rapitran II Wafer Transfer System Wafer Transfer- 5″ Metal
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5″ Rapitran II Wafer Transfer System Wafer Transfer- 5″ Metal
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5″ Transfer tool Used for LPCVD
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5″ Varian
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5″ Varian
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5″ Varian
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5″ Varian 3180 Front-Metal (RF +Ti +NiV +Au)
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5″ Varian 3190 Back-Metal (RF +Ti +NiV +Au)
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5″ Varian 3190 Barrier Metal (RF +Moly +15% NiPt +20% NiPt)
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5″ Varian 3190 Front-Metal (RF +Al +Al +Al)
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300mm Clean Oven – Espec ‘PVHC-431MS ‘

300mm Contact Angle Measurment Tester – Kyowa Interface Science ‘Drop Master 700D ‘

300mm Crystal Edge – ACCRETECH ‘Crystal Edge 2.0 ‘

300mm Furnace Group Controller – TEL ‘300 ‘

300mm Metal CVD – TEL ‘TRIAS ‘

300mm Metal Thickness Measurment Tester – Jordan Valley ‘JVX 6200 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3300 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3300 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3301 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3302 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3303 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3304 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3305 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3306 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3307 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3308 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3309 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3310 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3311 ‘

300mm Mixed Memory/Loic IC Test System – Agilent Technologies ‘V3312 ‘

300mm Mixed Memory/Loic IC Test System – HP ‘V3300 ‘

300mm Mixed Memory/Loic IC Test System – HP ‘V3300 ‘

300mm Mixed Memory/Loic IC Test System – HP ‘V3300 ‘

300mm Poly – Kokusai ‘Quixace Poly ‘

300mm Resistivity Test System – Kokusai ‘VR-120/08SD ‘

300mm Resistivity Test System – Kokusai ‘VR-120/08SD ‘

300mm Slurry &amp Cleaning Chemical Distribution System – Celerity ‘MegaFlow-VII ‘ (2007).

300mm Tester – RIGAKU ‘MFM65 ‘

300mm Wafer Inspection System – JEOL ‘JWS-3000 ‘

300mm Wafer Inspection System – JEOL ‘JWS-3000 ‘

300mm Wide Area AFM – Hitachi ‘WA1350 ‘

3ea Rohde & Schwarz URV5 Millivoltmeter, p/n 394.8010.02.

4-inch HFCVD System for CVD Diamond and Related Materials 4-inch HFCVD System for CVD Diamond and Related Materials

5 Station mesh stamper/placer

5 UP H73.5UP-002

5″ Rapitran II Wafer Transfer System Wafer Transfer- 5″ Metal

5″ Rapitran II Wafer Transfer System Wafer Transfer- 5″ Metal

5″ Transfer tool Used for LPCVD

5″ Varian

5″ Varian

5″ Varian

5″ Varian 3180 Front-Metal (RF +Ti +NiV +Au)

5″ Varian 3190 Back-Metal (RF +Ti +NiV +Au)

5″ Varian 3190 Barrier Metal (RF +Moly +15% NiPt +20% NiPt)

5″ Varian 3190 Front-Metal (RF +Al +Al +Al)