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  • LEICA AG KENSINGTON 2 STAGE LOT SPLITTER LTS08 Wafer Inspection Microscope

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    Applied Materials ComPLUS 3T

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  • DNS FC-3100

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  • Catalyst Teradyne Tester

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    Axcelis Technologies Inc. AD8912

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  • Jieketaiya TEP-2003

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  • YAMATAKE  MQV9200B524 

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  • KEITHLEY KEITHLEY 236 SOURCE MEASURE UNIT

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    Envirotronics FC 3000

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  • Nidec Tosok DBD3570S

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  • YAMATAKE  C206DA001D1 

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  • Aetrium Handler

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  • Struers

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  • HiKE DD-1206V-DF

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  • BLUE M electric DCC-1406E BAKE OVEN

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    Kokusai Electric Co. Ltd. AIT XP+

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  • KAIJO FB-105AH

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  • Applied Materials HDP Oxide Etch

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  • AKT  AKT-3500 

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  • Agilent Network Analyzer

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  • SVG Developer

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  • Hitachi Microanalys

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  • DNS DRS-SH (FS-820L) 8″ Wet Etching System

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