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Advantest T5581 / T5581H
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NEXTEST MAGNUM GV MEMORY TESTER
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Micro Instrument Co. PE9020
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ADVANTEST T5377S
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Verigy 93000 1600 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Solid State Measurement SSM-J90
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Tesec 8212-TS SOA Tester
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BOONTON 72B Capacitance Meter
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TEL P8XL Prober 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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TSK UF200A
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FEI Company Nova 600 NanoLab
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Source Measure Unit (SMU)
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Eles Semiconductor ART WLT&C200
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Dage 2400 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Advantest T5501
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Micro Instrument Co. PE9020
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Verigy V93000 C200e
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ESI 9275 (Modules and Parts only)
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Solartron SI 1255 HF Frequency Analyzer
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HEWLETT PACKARD 16500B Logic Analyzer
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Advantest T5592
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TSK UF200S
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FEI Company Strata 400
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Design Verification Tester
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FEI Company Dualbeam Expida 1265
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Dage 2400 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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300mm Wafer Fab Equipment
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Micro Instrument Co. SPC 4000
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Verigy V93000 PS400
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Wafer Bake System
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HEWLETT PACKARD 54601A 4CH Oscilloscope
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Advantest T5592 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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TSK UF200SA
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Design Verification Tester
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FEI Company Strata DB 235
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Laurier DS 3000
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Advantest T5592
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150mm Wafer Fab Equipment
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Mosaid Memory Tester MS3480
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Teradyne IP750EX Image Senor Test System – used semiconductor equipment
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Burn-in Test Chamber and System
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+ Solartron 1296 Dielectric Interface
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MKS Type 270A Signal Conditioner
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Advantest T2000
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Advantest T200
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