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Metrology equipment

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  • KLA AIT XP+

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  • KLA TENCOR AIT II

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  • KLA TENCOR 2800

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  • Hitachi (semiconductor) S 9380 II

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  • Hitachi (Semiconductor) RS 5500

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  • Hitachi (Semiconductor) RS 5000

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  • Hitachi (Semiconductor) IS 3000

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  • Leica Polylite 88 – Reichert Incident Light Microscope – Wafer Inspection

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  • Rigaku 3630 TXRF WAFER/DISK ANALYZER

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  • Rigaku 3630 TXRF WAFER/DISK ANALYZER

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  • Phoniex X-Ray PBGA  x1 set

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  • Phoniex X-Ray inspector  x1 set

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  • Sonoscan C-sam D6000 x1set

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  • Sonix C-sam  HS1000 x1set

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  • Other ATE

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