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Metrology equipment

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  • Sonoscan C-sam D6000 x1set

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  • KLA KLA5200 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • KLA TENCOR AIT II

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    Rudolph FE IV Ellipsometer 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Semicon China Equipment For Sale

    Semicon China Equipment For Sale

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  • Phoniex X-Ray inspector  x1 set

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  • SONIX Autowafer Scanning Acoustic Microscope

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  • KLA AIT XP+

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  • KLA-Tencor Surfscan 6220 Defect Inspection System

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  • Nikon MM 60

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  • Rudolph Technologies AXI 935D Macro Inspection System

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  • Phoniex X-Ray PBGA  x1 set

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  • SONIX Autowafer Scanning Acoustic Microscope 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • KLA Tencor AIM+

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  • Rudolph FE-VII Ellipsometer

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