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SAGAX Isoscope 125 Film Thickness Monitor
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SDI FAaST-330 Dielectric Characterization Tool
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TEMESCAL 0040-1054-2 XY Sweep Controller
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TENCOR Alphastep 300 Profilometer
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TENCOR M-Gage 300 Non Contact Resistance monitor
$
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TENCOR M-Gage 300 Non Contact Resistance with DDC
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TENCOR P20h Long Scan Profiler
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TENCOR Surfscan 4500 Wafer surface inspection
$
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VEECO Controller only
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ADE 9500 Ultrascan Wafer Inspection System
$
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Leica Polylite 88 – Reichert Incident Light Microscope – Wafer Inspection
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Applied System Veritystem 3
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Hitachi (Semiconductor) IS 3000
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Hitachi (Semiconductor) RS 5000
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Hitachi (Semiconductor) RS 5500
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