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Metrology
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“KLA 2608 Defect Review Station 200mm” has been added to your cart.
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“IONIC SYSTEMS Stressgauge II Wafer Stress Measurement” has been added to your cart.
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KLA SEM eCD-2 inspection measurement analysis – used metrology equipment
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Olympus MX51 Inspection Microscope
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SEM – Critical Dimension (CD) Measurement
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Overlay Measurement System
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BIORAD QS-1200 FT-IR Spectrometer 300mm
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TENCOR M-Gage 300 Non Contact Resistance monitor
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Olympus MX40 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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SEM – Critical Dimension (CD) Measurement
$
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Video Measuring System
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KLA-TENCOR AlphaStep 300 Profilometer
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Hitachi (semiconductor) S 9380 II
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AMAT SEMVision G3
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Met One Model 214-220-1
$
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Darkfield Inspection
$
0.00
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Leica MIS200 Ergoplan Inspection Station
$
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PLASMOS SD2003 Automatic Ellipsometer
$
0.00
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KLA Surfscan SP1 DLS Particle Measurement – used semiconductor equipment
$
0.00
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SEM – Critical Dimension (CD) Measurement
$
0.00
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Darkfield Inspection
$
0.00
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BIORAD QS-300 FT-IR Spectrometer 200mm
$
0.00
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TENCOR M-Gage 300 Non Contact Resistance with DDC
$
0.00
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Rudolph NSX 90
$
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Leica INM100 Wafer Inspection Microscope, Brightfield and Darkfield
$
25,000.00
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