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CSI Semi: Used and Refurbished Semiconductor Equipment. Surplus Semiconductor Equipment Service Provider.
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Metrology

“KLA 2608 Defect Review Station 200mm” has been added to your cart. View cart
“IONIC SYSTEMS Stressgauge II Wafer Stress Measurement” has been added to your cart. View cart
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  • FE SEM

    $0.00
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  • FT-IR

    $0.00
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  • GCA/TROPEL 9000 Surface Flatness Analyzer

    $0.00
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  • Hitachi (Semiconductor) IS 3000

    $0.00
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  • SONIX Autowafer Scanning Acoustic Microscope 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • Film Thickness measurment

    $0.00
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  • Darkfield Inspection

    $0.00
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  • Optical Review System

    $0.00
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  • PARTICLE MEASUREMENT SYSTEMS PDS-PB

    $0.00
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  • KLA UV1080 OPEN CASSETTE 二手半导体设备销售, 중고 반도체 장비 판매,

    $0.00
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  • Rudolph FE-IV Ellipsometer

    $0.00
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  • Darkfield Inspection

    $0.00
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  • Overlay Measurement System

    $0.00
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  • BIORAD Q7/Q8 Overlay Metrology Tool

    $0.00
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  • TEMESCAL 0040-1054-2 XY Sweep Controller

    $0.00
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  • Nikon MM 60 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • Rudolph Technologies AXI 935D Macro Inspection System

    $0.00
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  • FE SEM

    $0.00
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  • Optical Review System

    $0.00
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  • HITACHI S-7000 CD SEM

    $0.00
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  • Hitachi (Semiconductor) RS 5000

    $0.00
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  • Axiospect 300 Optical

    $0.00
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  • Leica INM100 Wafer Inspection Microscope, Brightfield and Darkfield

    $25,000.00
    Add to cart Show Details
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