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CSI Semi: Used and Refurbished Semiconductor Equipment. Surplus Semiconductor Equipment Service Provider.
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Metrology

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  • KLA Tencor 7600 Surfscan

    $0.00
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  • KLA TENCOR AIT II

    $0.00
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  • KLA Tencor RS75 x 2sets 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • KLA-TENCOR AlphaStep 300 Profilometer

    $0.00
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  • KLA-TENCOR FT-750 Film Thickness Inspection

    $0.00
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  • KLA-Tencor Surfscan 6220 Defect Inspection System

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  • KLA 6220

    KLA-TENCOR SURFSCAN 6220 DEFECT INSPECTION SYSTEM

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  • KLA-TENCOR UV 1080 UV Film Thickness Tool

    $0.00
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  • Leica INM100 Wafer Inspection Microscope, Brightfield and Darkfield

    $25,000.00
    Add to cart Show Details

  • Leica MIS200 Ergoplan Inspection Station

    $0.00
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  • Leica MIS201 Ergoplan Inspection Station

    $0.00
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  • Leica Polylite 88 – Reichert Incident Light Microscope – Wafer Inspection

    $0.00
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  • Luminescence Measurement

    $0.00
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  • Macro-Defect

    $0.00
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  • Macro-Defect

    $0.00
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  • Macro-Defect

    $0.00
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  • Macro-Defect

    $0.00
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  • Met One – Model 214-220-1

    $0.00
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  • MKS PAS Residual Gas Analyzer

    $0.00
    Add to cart Show Details

  • NANOMETRICS Nanoline CD-50 Measurement Tool

    $0.00
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  • NANOMETRICS Nanospec 181 Film Thickness Measurement

    $0.00
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  • NANOMETRICS Nanospec 2100 Film Thickness Measurement

    $0.00
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  • NICOLET Magna 550

    $0.00
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  • Nikon MM 60

    $0.00
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  • Nikon MM 60 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • NIKON NEXIV-VMR-3020 Video Measuring System Vintage 2015

    Nikon NEXIV VMZ-R3020 Multisensor 3D Video Meaurement CMM Vintage 2015 Type 2

    $0.00
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  • Olympus MX40

    $0.00
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  • Olympus MX40 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • Olympus MX51

    Olympus MX51 Inspection Microscope

    $0.00
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  • Olympus MX51 Inspection Microscope

    Olympus MX51 Inspection Microscope

    $0.00
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  • Optical Review System

    $0.00
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  • Optical Review System

    $0.00
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  • Optical Review System

    $0.00
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  • Overlay Measurement System

    $0.00
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  • Overlay Measurement System

    $0.00
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  • Overlay Measurement System

    $0.00
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  • PARTICLE MEASUREMENT SYSTEMS PDS-PB

    $0.00
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  • Parts/Options

    $0.00
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  • PHILIPS SPW-2800 Xray Fluorescence Metrology

    $0.00
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  • PLASMOS SD2000 Automatic Ellipsometer

    $0.00
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  • PLASMOS SD2003 Automatic Ellipsometer

    $0.00
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  • PROMETRIX FT-750 Film Thickness Measuring

    $0.00
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  • used semiconductor equipment

    quipement semi-conducteur, l’achat et la vente d’quipement de test et de fabrication de semi-conducteurs d

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  • RIGAKU 3630 Xray Fluorescence Wafer/Disk Analyzer

    $0.00
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  • RIGAKU 3640 Xray Fluorescence Wafer/Disk Analyzer

    $0.00
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