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Metrology

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  • SEM – Defect Review (DR)

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  • Macro-Defect

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  • BIORAD QS-408M Manual FT-IR Spectrometer for Epi, SiN, BPSG

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  • TENCOR P20h Long Scan Profiler

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  • Rudolph NSX 90 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • SEM – Critical Dimension (CD) Measurement

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  • Edge Defect

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  • KLA-TENCOR UV 1080 UV Film Thickness Tool

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  • KLA TENCOR AIT II

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  • AMAT Uvision 200

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  • Dektak 3030

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  • Darkfield Inspection

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  • KLA 2608 Wafer Review Station

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  • RIGAKU 3630 Xray Fluorescence Wafer/Disk Analyzer

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  • Brightfield Inspection

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  • Macro-Defect

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  • TENCOR Surfscan 4500 Wafer surface inspection

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  • Rudolph NSX 95

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  • Brightfield Inspection

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  • X-ray Fluorescence Spectrometer

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  • MKS PAS Residual Gas Analyzer

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  • KLA AIT XP+

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  • AMAT Uvision 200 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Shimadzu DUH 202 Ultra Micro Hardness Tester

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  • Darkfield Inspection

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  • KLA Tencor 7600 Surfscan

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  • RIGAKU 3640 Xray Fluorescence Wafer/Disk Analyzer

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    quipement semi-conducteur, l’achat et la vente d’quipement de test et de fabrication de semi-conducteurs d

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  • Brightfield Inspection

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  • BROOKFIELD DV-11+ Viscometer

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