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Metrology

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  • KLA-TENCOR FT-750 Film Thickness Inspection

    $0.00
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  • KLA TENCOR 2800

    $0.00
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  • AMAT SEMVision G3 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • SONOSCAN C-SAM 3100 (Acoustical Microscope)

    $0.00
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  • Darkfield Inspection

    $0.00
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  • Leica MIS201 Ergoplan Inspection Station

    $0.00
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  • PROMETRIX FT-750 Film Thickness Measuring

    $0.00
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  • NIKON NEXIV-VMR-3020 Video Measuring System Vintage 2015

    Nikon NEXIV VMZ-R3020 Multisensor 3D Video Meaurement CMM Vintage 2015 Type 2

    $0.00
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  • SEM – Defect Review (DR)

    $0.00
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  • Macro-Defect

    $0.00
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  • BIORAD QS-408M Manual FT-IR Spectrometer for Epi, SiN, BPSG

    $0.00
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  • TENCOR P20h Long Scan Profiler

    $0.00
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  • Rudolph NSX 90 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • SEM – Critical Dimension (CD) Measurement

    $0.00
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  • Edge Defect

    $0.00
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  • KLA-TENCOR UV 1080 UV Film Thickness Tool

    $0.00
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  • KLA TENCOR AIT II

    $0.00
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  • AMAT Uvision 200

    $0.00
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  • Dektak 3030

    $0.00
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  • Darkfield Inspection

    $0.00
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  • KLA 2608 Wafer Review Station

    $0.00
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  • RIGAKU 3630 Xray Fluorescence Wafer/Disk Analyzer

    $0.00
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  • Brightfield Inspection

    $0.00
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  • Macro-Defect

    $0.00
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  • TENCOR Surfscan 4500 Wafer surface inspection

    $0.00
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  • Rudolph NSX 95

    $0.00
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  • Brightfield Inspection

    $0.00
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  • X-ray Fluorescence Spectrometer

    $0.00
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  • MKS PAS Residual Gas Analyzer

    $0.00
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  • KLA AIT XP+

    $0.00
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Page 3 of 6‹12345›»

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