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Metrology
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Atomic Force Microscope (AFM)
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KLA UV1280SE 二手半导体设备销售, 중고 반도체 장비 판매
$
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Hitachi (Semiconductor) RS 5500
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Video Measuring System
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Met One Model 214-220-1
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Darkfield Inspection
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Leica MIS200 Ergoplan Inspection Station
$
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PLASMOS SD2003 Automatic Ellipsometer
$
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Leica INM100 Wafer Inspection Microscope, Brightfield and Darkfield
$
25,000.00
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SEM – Critical Dimension (CD) Measurement
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Darkfield Inspection
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BIORAD QS-300 FT-IR Spectrometer 200mm
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TENCOR M-Gage 300 Non Contact Resistance with DDC
$
0.00
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Rudolph NSX 90
$
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SEM – Critical Dimension (CD) Measurement
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