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CSI Semi: Used and Refurbished Semiconductor Equipment. Surplus Semiconductor Equipment Service Provider.
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Metrology

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  • KLA Surfscan SP1 DLS Particle Measurement – used semiconductor equipment

    $0.00
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  • Hitachi S-3400N

    $0.00
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  • Olympus MX51 Inspection Microscope

    Olympus MX51 Inspection Microscope

    $0.00
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  • BIORAD QS-500 FT-IR Spectrometer

    $0.00
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  • Thermawave optiprobe 2600

    Thermawave 2600(8inch) for sale

    $0.00
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  • used semiconductor equipment

    HITACHI FB2000 + FB2100 FIB SYSTEMS

    $0.00
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  • ADE 9600 Ultrascan

    ADE 9600 Ultrascan High Speed Measurement and Sorting System for sale

    $0.00
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  • Hitachi CG4000

    $0.00
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  • 30 Day Warranty Parts, AMAT, LAM, Novellus, Nikon,Varian, KLA, TEL, SVG, Cryogenics, Gasonics, Hitachi, Keithley, HP, MFC,

    $0.00
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  • KLA ASET F5 Thin Film Measurement, 测量薄膜, 박막 측정,

    $0.00
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  • Video Measuring System

    $0.00
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  • used semiconductor equipment

    HITACHI S5000 SEM

    $0.00
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  • ADE 9500 Ultra Gauge

    ADE 9500 for sale

    $0.00
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  • Macro-Defect

    $0.00
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  • KLA Tencor RS75 x 2sets 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • KLA SP1 DLS 1 Surfscan

    KLA SP1 DLS for sale

    $0.00
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  • Atomic Force Microscope (AFM)

    $0.00
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  • KLA UV1280SE 二手半导体设备销售, 중고 반도체 장비 판매

    $0.00
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  • Hitachi (Semiconductor) RS 5500

    $0.00
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  • SEM – Critical Dimension (CD) Measurement

    $0.00
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  • Overlay Measurement System

    $0.00
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  • BIORAD QS-1200 FT-IR Spectrometer 300mm

    $0.00
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  • TENCOR M-Gage 300 Non Contact Resistance monitor

    $0.00
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  • Olympus MX40 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • SEM – Critical Dimension (CD) Measurement

    $0.00
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  • KLA-TENCOR AlphaStep 300 Profilometer

    $0.00
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  • Hitachi (semiconductor) S 9380 II

    $0.00
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  • AMAT SEMVision G3

    $0.00
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  • Met One – Model 214-220-1

    $0.00
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  • Darkfield Inspection

    $0.00
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  • Leica MIS200 Ergoplan Inspection Station

    $0.00
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  • PLASMOS SD2003 Automatic Ellipsometer

    $0.00
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  • Leica INM100 Wafer Inspection Microscope, Brightfield and Darkfield

    $25,000.00
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  • SEM – Critical Dimension (CD) Measurement

    $0.00
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  • Darkfield Inspection

    $0.00
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  • BIORAD QS-300 FT-IR Spectrometer 200mm

    $0.00
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  • TENCOR M-Gage 300 Non Contact Resistance with DDC

    $0.00
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  • Rudolph NSX 90

    $0.00
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  • SEM – Critical Dimension (CD) Measurement

    $0.00
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  • Image Sensor Tester

    $0.00
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  • KLA-TENCOR FT-750 Film Thickness Inspection

    $0.00
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  • KLA TENCOR 2800

    $0.00
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  • AMAT SEMVision G3 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • SONOSCAN C-SAM 3100 (Acoustical Microscope)

    $0.00
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  • Darkfield Inspection

    $0.00
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