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Inspection

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  • KLA SEM eCD-2 inspection measurement analysis – used metrology equipment

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  • 30 Day Warranty Parts, AMAT, LAM, Novellus, Nikon,Varian, KLA, TEL, SVG, Cryogenics, Gasonics, Hitachi, Keithley, HP, MFC,

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  • Cyberoptics Corporation 8010949

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  • Leica Polylite 88 – Reichert Incident Light Microscope – Wafer Inspection

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  • VISTEC LDS3300M

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  • VISTEC LDS3300M

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  • NEGEVTECH 302 for 12″ / 300 mm

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  • LINK ANALYTICAL LTD INCA L3000QI

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  • KLA eS-32 for 12″ / 300 mm

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  • KLA AIT 2 for 12 inch

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  • ISP3000 Creden 3rd Optial Inspection System

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  • AMAT Compass Pro 300

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  • AMAT Compass Pro 300

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  • Leica MIS200 Wafer Inspection 200mm

    $0.00
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  • WILD M420 Microscope

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