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Inspection

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  • WENTWORTH LABS HOP “Hands Off Probe”

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  • VISION ENGINEERING Dynascope

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  • TECHNICAL INSTRUMENT K2 IND/NIKON Confocal Microscope

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  • SAGITTA ECP-2000 Cross Section Polisher

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  • OLYMPUS SZ3060 StereoZoom Microsope

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  • OLYMPUS BH-BHM Wafer Inspection Microscope

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  • NIKON V-12 Optical Comparator

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  • NIKON Optistation 3A Automatic Wafer Inspection

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  • NIKON Optistation 3 Automatic Wafer Inspection

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  • NIKON Optistation 2A Automatic Wafer Inspection

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  • NIKON Optiphot 88 Binocular Microscope

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  • NIKON Optiphot 200 Wafer Inspection Microscope

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  • NIKON Optiphot 150 Wafer Inspection Microscope

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  • NIKON Optiphot Wafer Inspection Microscope

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  • LEICA

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  • KLA-TENCOR Surfscan AIT 8020 Patterned Wafer Surface Inspection

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  • KLA-TENCOR Surfscan AIT Patterned Wafer Surface Inspection

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  • KLA-TENCOR Surfscan 7700 Patterned Wafer Surface Inspection

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  • IRVINE OPTICAL Ultrastation 3 Macro Inspection Station

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  • IRVINE OPTICAL UltraSpec III Wafer Inspection Station

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  • IRVINE OPTICAL Optistation 200 Wafer Inspection Station

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  • BAUSCH & LOMB StereoZoom 7 Microscope

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  • BAUSCH & LOMB StereoZoom 6-ST Microscope

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  • BAUSCH & LOMB StereoZoom 4 Microscope

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  • BAUSCH & LOMB StereoZoom 4 Microscope

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  • BAUSCH & LOMB StereoZoom 4 Microscope

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Page 2 of 212

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