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  • Batch Wafer Processing

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  • Advanced Metrology Systems LLC (AMS) IR3000

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  • Dynamic Micro Systems 2090

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  • used semiconductor equipment

    Rudolph FE IV Ellipsometer

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  • Nikon MM 60

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  • AMAT Centura

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  • FSI MERCURY 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • TEL Clean Track ACT8

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  • Nicolet ECO-1000S

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  • Applied Materials CENTURA4 5200 Centura DPS+ Poly/Super E

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  • SPTS Pegasus DRIE

    SPTS Pegasus DRIE (Deep Reactive Ion Etch) Vintage 2008

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  • TEL Clean Track ACT 12

    TEL Clean Track ACT 12 200mm 2C4D DUV Coater Developer

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  • Oxford Plasmalab 800 Plus PLC RIE

    Oxford Plasmalab 800 Plus PLC RIE

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  • VG Wet Bench

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  • ASML XT 1250 DUV 193nm Scanner

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Page 17 of 42«‹1516171819›»

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