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CSI Semi: Used and Refurbished Semiconductor Equipment. Surplus Semiconductor Equipment Service Provider.
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Metrology

View cart “Applied Materials Uvision 3” has been added to your cart.
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  • Axiospect 300 Optical 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Axiospect 300 Optical

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  • SONIX Autowafer Scanning Acoustic Microscope 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • SONIX Autowafer Scanning Acoustic Microscope

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  • KLA KLA5200 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • KLA KLA5200

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  • Rudolph NSX 95 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Rudolph NSX 95

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  • Rudolph NSX 90 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Rudolph NSX 90

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  • Nikon MM 60 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Nikon MM 60

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  • used semiconductor equipment

    Accent Optical Biorad QS 500 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • used semiconductor equipment

    Accent Optical Biorad QS 500

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  • used semiconductor equipment

    Rudolph FE IV Ellipsometer 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • used semiconductor equipment

    Rudolph FE IV Ellipsometer

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  • used semiconductor equipment

    二手半导体设备、库存半导体设备、翻新半导体设备、二手测试设备、翻新测试设备、库存测试设备、二手自动测试设备、二手印制电路板（pcb）组装设备、组装设备、二手电子组装设备、二手电子测试设备、半导体固定设备

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  • used semiconductor equipment

    quipement semi-conducteur, l’achat et la vente d’quipement de test et de fabrication de semi-conducteurs d

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  • KLA 5400 Film Stress Measurement

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  • KLA Surfscan SP1 DLS Particle Measurement – used semiconductor equipment

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  • KLA SEM eCD-2 inspection measurement analysis – used metrology equipment

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  • KLA 6420 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • KLA TENCOR RS 75A OMNIMAP

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  • KLA ASET F5 Thin Film Measurement, 测量薄膜, 박막 측정,

    $0.00
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  • KLA ASET F5X Thin Film Metrology 중고 반도체 장비 박막 계측, 二手半导体设备测量薄膜,

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  • KLA UV1080 OPEN CASSETTE 二手半导体设备销售, 중고 반도체 장비 판매,

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  • KLA UV1280SE 二手半导体设备销售, 중고 반도체 장비 판매

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  • KLA TENCOR PROMETRIX UV1280SE

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  • KLA Tencor AIM+

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  • KLA AIT XUV

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  • KLA AIT XP+

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  • KLA TENCOR AIT II

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  • Hitachi (Semiconductor) RS 5500

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  • Dainippon Screen MFG Co Lambda ACE VM-3100

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  • Applied System Veritystem 3

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  • Applied Materials Veritystem 2

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  • Applied Materials Veritysem

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  • Applied Materilas Uvision 5

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  • Applied Materials Uvision 4

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  • Applied Materials Semivision G4

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  • Applied Materials Nanosem 3D

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  • Applied Materials Complus MP

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  • Applied Materials Complus 4T

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  • Advanced Metrology Systems LLC (AMS) IR3000

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  • Leica Polylite 88 – Reichert Incident Light Microscope – Wafer Inspection

    $0.00
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Page 2 of 3123

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