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Metrology

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  • Rudolph FE-IV Ellipsometer

    $0.00
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  • Rudolph FE-VII Ellipsometer

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  • KLA-Tencor Surfscan 6220 Defect Inspection System

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  • Nicolet 410 (FT-IR) Spectrometer

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  • RUDOLPH TECHNOLOGIES INC. – Focus FE III Ellipsometer

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  • Orbot WF736 (Darkfield Inspection)

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  • APPLIED MATERIALS SEMVision G2 – Defect Review Station (Module Only)

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  • KLA-Tencor – KLA2139

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  • Hitachi S-9200

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  • APPLIED MATERIALS SEMVISION G2

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  • APPLIED MATERIALS SEMVISION G4

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  • OLYMPUS MM6C-CS50-2 (2D Scope)

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  • Nikon AMI-3500

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  • KLA-Tencor Surfscan SP1 DLS

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  • Asyst PST100 Wafer Sorter

    $0.00
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