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Metrology

View cart “OLYMPUS MM6C-CS50-2 (2D Scope)” has been added to your cart.
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  • Hitachi (Semiconductor) RS 5500

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  • Axiospect 300 Optical 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Zeiss Axiotron II Microscopes (8 units available)

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  • KLA 2132 wafer defect inspection

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  • KLA 6420 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Hitachi CG4000

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  • Applied Materials Complus 4T

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  • Nikon MM 60 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Hitachi S-9200

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  • KLA TENCOR AIT II

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  • AMAT SEMVision G3

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  • NanoMetrics NanoSpec 8300

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  • KLA 2131 Defect Wafer Inspection System 200mm

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  • KLA SEM eCD-2 inspection measurement analysis – used metrology equipment

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  • Hitachi S-3400N

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  • leica ins3300

    Leica INS 3300

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  • Applied Materials Complus MP

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  • Rudolph NSX 90

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  • KLA-Tencor – KLA2139

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  • KLA AIT XP+

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  • AMAT SEMVision G3 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • Olympus MX50 Microscope & AL110-L8 Autoloader

    $0.00
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  • KLA 2608 Defect Review Station 200mm

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  • KLA Surfscan SP1 DLS Particle Measurement – used semiconductor equipment

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  • Hitachi S8820HSA

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  • Applied Materials Nanosem 3D

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  • Rudolph NSX 90 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

    $0.00
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  • APPLIED MATERIALS SEMVision G2 – Defect Review Station (Module Only)

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  • KLA Tencor AIM+

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  • AMAT Uvision 200

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