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Metrology

View cart “KLA-Tencor Surfscan SP1 DLS” has been added to your cart.
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  • KLA 2608 Wafer Review Station 8 Inch

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  • KLA 5400 Film Stress Measurement

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  • Nicolet ECO-1000S

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  • Rudolph NSX 95

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  • Orbot WF736 (Darkfield Inspection)

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  • KLA TENCOR RS 75A OMNIMAP

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  • AMAT Uvision 200 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • Dektak 150 Surface Profiler

    Dektak 150 Surface Profiler + Warranty + Delivery to USA

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  • KLA Surfscan 7600 Patterned Wafer Inspection 8 Inch

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    quipement semi-conducteur, l’achat et la vente d’quipement de test et de fabrication de semi-conducteurs d

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  • SDI SPV-1050

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  • Applied Materials Uvision 4

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  • Rudolph NSX 95 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung

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  • RUDOLPH TECHNOLOGIES INC. – Focus FE III Ellipsometer

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