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Olympus MX51 Inspection Microscope
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Accretech TSK UF200 x 11sets, TSKUF200S x 2sets, UF200A x 2sets, UF200SA available 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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TSK UF200
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NEXTEST MAVERICK PT II Memory Tester x 3 sets
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Teradyne Microflex Tester
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Verigy V93000 PS1600
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Teradyne J750
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30 Day Warranty Parts, AMAT, LAM, Novellus, Nikon,Varian, KLA, TEL, SVG, Cryogenics, Gasonics, Hitachi, Keithley, HP, MFC,
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TSK UF190B
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ACCRETECH / TSK UF3000
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TEL P8XL Prober
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Cascade Summit 12000 Engineering Wafer Prober
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Advantest T5377 / T5377S
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+ Solartron SI 1287 Electrochemical Analyzer
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FEI Company Strata DB 235
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Sonoscan C-SAM Series D9000
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Teradyne Ultra Flex Dcio Board
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SCHAFFNER NSG 500C/506C Pulse Generator
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Teradyne J750K Testers
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TSK UF3000
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Advantest T5377
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二手半导体设备、库存半导体设备、翻新半导体设备、二手测试设备、翻新测试设备、库存测试设备、二手自动测试设备、二手印制电路板（pcb）组装设备、组装设备、二手电子组装设备、二手电子测试设备、半导体固定设备
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Memory Tester
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TEKTRONIX 577-D2 Curve Tracer
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Agilent Technologies Inc 4073A
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Dage BT24
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Advantest T5571P
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Yokogawa MT6060 Wafer Tester
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Micro Instrument Co. PE9000A
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TERADYNE J750EX Final Test x 2 sets Vintage 2014 – Asia – Direct from FAB
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Verigy 93000 PS400 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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SSM SSM150
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TESTELEC 201 A Test systém
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Carbolite Oven
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Parametric Tester
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THERMONICS T-2400R Temperature Forcing Unit
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Akrion SA.2300
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Dage BT24 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Advantest T5581 / T5581H
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NEXTEST MAGNUM GV MEMORY TESTER
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Micro Instrument Co. PE9020
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ADVANTEST T5377S
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Verigy 93000 1600 二手半导体设备, 中古半導体装置, 二手半導體設備, quipement semi-conducteur, benutzte halbleiterausstattung
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Solid State Measurement SSM-J90
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Tesec 8212-TS SOA Tester
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BOONTON 72B Capacitance Meter
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Olympus MX51 Inspection Microscope
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